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Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XI : 23-24 January 2012, San Francisco, California, United States ebook

Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XI : 23-24 January 2012, San Francisco, California, United States ebook

Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XI : 23-24 January 2012, San Francisco, California, United States.cSonia Garcia-Blanco
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XI : 23-24 January 2012, San Francisco, California, United States
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Author: Sonia Garcia-Blanco
Number of Pages: 174 pages
Published Date: 15 Apr 2012
Publisher: SPIE Press
Publication Country: Bellingham, United States
Language: none
ISBN: 9780819488930
File size: 36 Mb
Download Link: Reliability, Packaging, Testing, and Characterization of MEMS MOEMS and Nanodevices XI 23-24 January 2012, San Francisco, California, United States
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